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Zhurnal Tekhnicheskoi Fiziki, 2018, Volume 88, Issue 1, Pages 89–92
DOI: https://doi.org/10.21883/JTF.2018.01.45488.2327
(Mi jtf6024)
 

This article is cited in 4 scientific papers (total in 4 papers)

Optics

Generation of high-voltage pulses by sharp-recovery SiC drift diodes (n-base versus p-base diodes)

P. A. Ivanov, I. V. Grekhov

Ioffe Institute, St. Petersburg
Full-text PDF (139 kB) Citations (4)
Abstract: The time characteristics of pulse generators based on sharp-recovery 4H : SiC drift diodes have been calculated. It has been found that the speed of n-base 4H-SiC diodes is superior to that of p-base diodes with the amplitude and initial pedestal in the output voltage (< 5% of the amplitude) versus the time curve being the same.
Funding agency Grant number
Russian Science Foundation 14-29-00094
Received: 11.05.2017
English version:
Technical Physics, 2018, Volume 63, Issue 1, Pages 86–89
DOI: https://doi.org/10.1134/S1063784218010152
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: P. A. Ivanov, I. V. Grekhov, “Generation of high-voltage pulses by sharp-recovery SiC drift diodes (n-base versus p-base diodes)”, Zhurnal Tekhnicheskoi Fiziki, 88:1 (2018), 89–92; Tech. Phys., 63:1 (2018), 86–89
Citation in format AMSBIB
\Bibitem{IvaGre18}
\by P.~A.~Ivanov, I.~V.~Grekhov
\paper Generation of high-voltage pulses by sharp-recovery SiC drift diodes ($n$-base versus $p$-base diodes)
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2018
\vol 88
\issue 1
\pages 89--92
\mathnet{http://mi.mathnet.ru/jtf6024}
\crossref{https://doi.org/10.21883/JTF.2018.01.45488.2327}
\elib{https://elibrary.ru/item.asp?id=32737524}
\transl
\jour Tech. Phys.
\yr 2018
\vol 63
\issue 1
\pages 86--89
\crossref{https://doi.org/10.1134/S1063784218010152}
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  • https://www.mathnet.ru/eng/jtf6024
  • https://www.mathnet.ru/eng/jtf/v88/i1/p89
  • This publication is cited in the following 4 articles:
    1. Dengyao Guo, Xiaoyan Tang, Jingkai Guo, Yu Zhou, Lejia Sun, Yu Zhang, Yuming Zhang, Qingwen Song, “Theoretical Model, Experimental Survey, and Optimization of Pulse Parameters for 4H-SiC Drift Step Recovery Diode”, IEEE Trans. Plasma Sci., 53:4 (2025), 721  crossref
    2. D. Guo, X. Tang, J. Guo, Y. Zhou, Z. Jiang, Y. Feng, Y. Zhang, Q. Song, 2024 IEEE International Conference on Plasma Science (ICOPS), 2024, 1  crossref
    3. P A Bokhan, P P Gugin, M A Lavrukhin, D E Zakrevsky, I V Schweigert, A L Alexandrov, “Investigation of the characteristics and mechanism of subnanosecond switching of a new type of plasma switches. I. Devices with counter-propagating electron beams—kivotrons”, Plasma Sources Sci. Technol., 29:8 (2020), 084002  crossref
    4. A. A. Lebedev, P. A. Ivanov, M. E. Levinshtein, E. N. Mokhov, S. S. Nagalyuk, A. N. Anisimov, P. G. Baranov, “SiC-based electronics (100th anniversary of the Ioffe Institute)”, Phys. Usp., 62:8 (2019), 754–794  mathnet  crossref  crossref  adsnasa  isi  elib
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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