Ultrashort pulses in the structural analysis of diamond layers with NV centers

The X-ray diffraction analysis is one of the main methods to determine the structure of crystalline materials using both cw X rays and ultrashort pulses. Ultrashort pulses are usually utilized to observe dynamic processes in atomic and molecular systems. In this work, it has been shown that ultrashort pulses can have another important application in the determination of the interplanar distance between diamond layers with NV centers, which can be separated by only several angstroms. The obtained results can be extended to more complex structures and can be finally developed to a new three-dimensional tomography method with angstrom resolution.