Abstract:
A surface electromagnetic wave has been excited on an atomically smooth silicon surface by an intense infrared femtosecond laser pulse as a result of its self-diffraction on a microscale short-lived optical inhomogeneity of the excitation region rather than on the roughness of its surface relief. This wave has been visualized in the form of the pattern of its interference with the same incident infrared ultrashort pulse, which corresponds to the instantaneous surface dielectric constant grating (reflection), as well as the resulting surface relief grating, using time-resolved far-field optical reflection microscopy.
Citation:
A. A. Ionin, S. I. Kudryashov, L. V. Seleznev, D. V. Sinitsyn, V. I. Emel'yanov, “Nonlinear regime of the excitation of a surface electromagnetic wave on the silicon surface by an intense femtosecond laser pulse”, Pis'ma v Zh. Èksper. Teoret. Fiz., 97:3 (2013), 139–144; JETP Letters, 97:3 (2013), 121–125
\Bibitem{IonKudSel13}
\by A.~A.~Ionin, S.~I.~Kudryashov, L.~V.~Seleznev, D.~V.~Sinitsyn, V.~I.~Emel'yanov
\paper Nonlinear regime of the excitation of a surface electromagnetic wave on the silicon surface by an intense femtosecond laser pulse
\jour Pis'ma v Zh. \`Eksper. Teoret. Fiz.
\yr 2013
\vol 97
\issue 3
\pages 139--144
\mathnet{http://mi.mathnet.ru/jetpl3340}
\crossref{https://doi.org/10.7868/S0370274X13030016}
\elib{https://elibrary.ru/item.asp?id=18854541}
\transl
\jour JETP Letters
\yr 2013
\vol 97
\issue 3
\pages 121--125
\crossref{https://doi.org/10.1134/S0021364013030041}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=000317966100001}
\elib{https://elibrary.ru/item.asp?id=20437098}
\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-84876454251}
Linking options:
https://www.mathnet.ru/eng/jetpl3340
https://www.mathnet.ru/eng/jetpl/v97/i3/p139
This publication is cited in the following 25 articles:
Asadullah Dawood, Muhammad Asad Khan, Shazia Bashir, Ambreen Ayub, Asma Hayat, Joseph H. Sanderson, Naveed Ahmed Chishti, Appl. Opt., 63:13 (2024), 3585
Asadullah Dawood, Shazia Bashir, Muhmmad Asad Khan, Asma Hayat, Ebenezer Bonyah, Joseph H. Sanderson, Mehwish Majeed, Zarish Naz, AIP Advances, 14:5 (2024)
Igor Girka, Manfred Thumm, Springer Series on Atomic, Optical, and Plasma Physics, 120, Surface Flute Waves in Plasmas, 2022, 367
Kesaev V. L. A. D. I. M. I. R. Nastulyavichus A. L. E. N. A. Kudryashov S. E. R. G. E. Y. Kovalev M. I. C. H. A. E. L. Stsepuro N. I. K. I. T. A. Krasin G. E. O. R. G. E., Opt. Mater. Express, 11:7 (2021), 1971–1977
Aliev Yu.M., Frolov A.A., Chizhonkov V E., Phys. Scr., 95:5 (2020), 055607
Hayat A., Bashir Sh., Strickland D., Rafique M.Sh., Wales B., Al-Tuairqi S., Sanderson J.H., J. Appl. Phys., 125:8 (2019), 083302
S. I. Kudryashov, L. V. Seleznev, A. A. Rudenko, A. A. Ionin, JETP Letters, 109:3 (2019), 157–162
T. Apostolova, B. D. Obreshkov, A. A. Ionin, S. I. Kudryashov, S. V. Makarov, N. N. Mel'nik, A. A. Rudenko, Appl. Surf. Sci., 427:A (2018), 334–343
Nisar Ali, Shazia Bashir, Umm-i-Kalsoom, M. Shahid Rafique, Narjis Begum, Wolfgang Husinsky, Optik, 134 (2017), 149–160
A. A. Frolov, S. A. Uryupin, 10Th International Workshop 2017 Strong Microwaves and Terahertz Waves: Sources and Applications, EPJ Web Conf., 149, ed. A. Litvak, EDP Sciences, 2017, UNSP 05016
A. A. Ionin, S. I. Kudryashov, A. O. Levchenko, L. V. Nguyen, I. N. Saraeva, A. A. Rudenko, E. I. Ageev, D. V. Potorochin, V. P. Veiko, E. V. Borisov, D. V. Pankin, D. A. Kirilenko, P. N. Brunkov, Appl. Surf. Sci., 416 (2017), 988–995
G. D. Tsibidis, E. Stratakis, J. Appl. Phys., 121:16 (2017), 163106
S. A. Uryupin, A. A. Frolov, JETP Letters, 103:8 (2016), 499–503
Inogamov N.A. Zhakhovsky V.V. Ashitkov S.I. Emirov Yu.N. Faenov A.Ya. Petrov Yu.V. Khokhlov V.A. Ishino M. Demaske B.J. Tanaka M. Hasegawa N. Nishikino M. Tamotsu S. Pikuz T.A. Skobelev I.Y. Ohba T. Kaihori T. Ochi Y. Imazono T. Fukuda Y. Kando M. Kato Y. Kawachi T. Anisimov S.I. Agranat M.B. Oleynik I.I. Fortov V.E., Eng. Fail. Anal., 47:B, SI (2015), 328–337